Design For Test ( DFT )
Design for testing or Design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product’s correct functioning.
DFT plays an important role in the development of test programs and as an interface for test application and diagnostics. Automatic test pattern generation, or ATPG, is much easier if appropriate DFT rules and suggestions have been implemented.
DFT Training Program Details:
Domain : VLSI
Period : 6 months
Eligibility : Candidate must have completed B.E./B.Tech/M.E/M.Tech(ECE, EEE,EIE,CSE) with min 70% and above.
Selection Procedure : Written test + Interview
- 100% Job placement is Assisted.!!!
- Trained by Industry Experts.
To know more about the training program and for enquiries on admission and other information do contact us through firstname.lastname@example.org or through +91- 9787860209